Sign in
Extracting significant features based on candlestick patterns using unsupervised approach
Conference paper

Extracting significant features based on candlestick patterns using unsupervised approach

S. Sangsawad and C.C. Fung
2017 2nd International Conference on Information Technology (INCIT)
2nd International Conference on Information Technology (INCIT) 2017 (Nakhonpathom, Thailand, 02/11/2017–03/11/2017)
2017
url
Link to Published Version *Subscription may be requiredView

Abstract

Details

Metrics

149 Record Views
Logo image