XPS valence band spectroscopy as an analytical tool - a study of hydrogenated amorphous silicon

Conference paper

C.P. Lund, C. Klauber, E. Walker, P.J. Jennings, B.W. Clare, J.C.L. Cornish and G.T. Hefter

Australasia-Asia XPS Symposium (Sydney, Australia, 14/11/1995–17/11/1995)

1995

Details

Title: XPS valence band spectroscopy as an analytical tool - a study of hydrogenated amorphous silicon
Authors/Creators: C.P. Lund (Author/Creator)
C. Klauber (Author/Creator)
E. Walker (Author/Creator)
P.J. Jennings (Author/Creator)
B.W. Clare (Author/Creator)
J.C.L. Cornish (Author/Creator)
G.T. Hefter (Author/Creator)
Conference: Australasia-Asia XPS Symposium (Sydney, Australia, 14/11/1995–17/11/1995)
Identifiers: 991005544199307891
Murdoch Affiliation: School of Mathematical and Physical Sciences
Language: English
Resource Type: Conference paper

135 Record Views