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Cr based attenuated phase shifting mask materials for 193nm lithography
Conference presentation

Cr based attenuated phase shifting mask materials for 193nm lithography

E. Kim, S.B. Hong, Z-T Jiang, K. No, S. Lim, S-G Woo and Y-B Koh
Second international symposium on 193nm lithography (Colorado Springs, Colorado, 30/07/1996–02/08/1996)
1996

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