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Optical properties of Al-Cr oxide films by spectroscopic ellipsometry
Conference presentation

Optical properties of Al-Cr oxide films by spectroscopic ellipsometry

Z-T Jiang, Y. Fujita, M. Aoyama and T. Yamaguchi
The Japan Society of Applied Physics (The 45th Spring Meeting) (Tokyo, Japan, 28/03/1998–30/03/1998)
1998

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