Journal article
An electron spectrometer for LEED fine structure measurements
Applied Surface Science, Vol.24(2), pp.202-212
1985
Abstract
LEED fine structure analysis requires intensity versus energy data for very low energy electrons (typically 5–25 eV) at various angles of incidence and azimuth. An electron spectrometer capable of fulfilling these requirements was built and used to obtain data for Cu(111). This spectrometer differs from others used for these type of measurements in that it used a retarding field analyzer to collect the elastically scattered beams instead of a deflecting analyzer. This considerably simplifies the apparatus required and the experimental procedure as the collector can be used at a fixed angle to collect data from a number of different angles of incidence. The experimental design is discussed and sample results, showing that three peaks were resolved, are presented.
Details
- Title
- An electron spectrometer for LEED fine structure measurements
- Authors/Creators
- S. Thurgate (Author/Creator) - Murdoch UniversityG. Hitchen (Author/Creator) - Murdoch University
- Publication Details
- Applied Surface Science, Vol.24(2), pp.202-212
- Publisher
- Elsevier BV
- Identifiers
- 991005545527007891
- Copyright
- © 1985 Published by Elsevier B.V.
- Murdoch Affiliation
- School of Mathematical and Physical Sciences
- Language
- English
- Resource Type
- Journal article
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- Citation topics
- 5 Physics
- 5.31 Silicon Systems
- 5.31.871 Silicon Surface Chemistry
- Web Of Science research areas
- Chemistry, Physical
- Materials Science, Coatings & Films
- Physics, Applied
- Physics, Condensed Matter
- ESI research areas
- Materials Science