Abstract
Synchrotron radiation sources have proven to be highly beneficial in many fields of research for the characterization of materials. However, only a very limited proportion of studies have been conducted by the forensic science community. This is an area in which the analytical benefits provided by synchrotron sources could prove to be very important. This review summarises the applications found for synchrotron radiation in a forensic trace evidence context as well as other areas of research that strive for similar analytical scrutiny and/or are applied to similar sample materials. The benefits of synchrotron radiation are discussed in relation to common infrared, X-ray fluorescence, tomographic and briefly, X-ray diffraction and scattering techniques. In addition, X-ray absorption fine structure analysis (incorporating XANES and EXAFS) is highlighted as an area in which significant contributions into the characterization of materials can be obtained. The implications of increased spatial resolution on microheterogeneity are also considered and discussed.
