Journal article
Determination of the surface-potential barrier of Cu(001) from low-energy-electron-diffraction fine structure
Physical Review B, Vol.44(8), pp.3939-3942
1991
Abstract
The surface-potential barrier shape for the (001) face of copper was determined by an analysis of low-energy-electron-diffraction fine-structure measurements. The fitting of the fine-structure spectra was performed with a precise knowledge of the incident diffraction conditions of the experimental data (incidence angle, azimuthal angle, and contact-potential difference). This precision is necessary to allow a consistent barrier shape to be determined. For three different angles of incidence, it was found that a good match between theoretical and experimental I-V spectra was obtained when the image plane was located 2.5 a.u. from the topmost layer of atoms.
Details
- Title
- Determination of the surface-potential barrier of Cu(001) from low-energy-electron-diffraction fine structure
- Authors/Creators
- G.J. Hitchen (Author/Creator) - Murdoch UniversityS.M. Thurgate (Author/Creator)P.J. Jennings (Author/Creator) - Murdoch University
- Publication Details
- Physical Review B, Vol.44(8), pp.3939-3942
- Publisher
- American Physical Society
- Identifiers
- 991005542596507891
- Copyright
- © 1991 The American Physical Society.
- Murdoch Affiliation
- School of Mathematical and Physical Sciences
- Language
- English
- Resource Type
- Journal article
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- Citation topics
- 5 Physics
- 5.31 Silicon Systems
- 5.31.871 Silicon Surface Chemistry
- Web Of Science research areas
- Materials Science, Multidisciplinary
- Physics, Applied
- Physics, Condensed Matter
- ESI research areas
- Physics