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Genetics and breeding for resistance against four leaf spot diseases in wheat (Triticum aestivum L.)
Journal article   Open access   Peer reviewed

Genetics and breeding for resistance against four leaf spot diseases in wheat (Triticum aestivum L.)

Pushpendra Kumar Gupta, Neeraj Kumar Vasistha, Sahadev Singh and Arun Kumar Joshi
Frontiers in plant science, Vol.14, Art. 1023824
2023
PMID: 37063191
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Published2.44 MBDownloadView
CC BY V4.0 Open Access

Abstract

necrotrophic effectors pathogens Plant Science PR proteins resistance genes sensitivity genes wheat
In wheat, major yield losses are caused by a variety of diseases including rusts, spike diseases, leaf spot and root diseases. The genetics of resistance against all these diseases have been studied in great detail and utilized for breeding resistant cultivars. The resistance against leaf spot diseases caused by each individual necrotroph/hemi-biotroph involves a complex system involving resistance (R) genes, sensitivity (S) genes, small secreted protein (SSP) genes and quantitative resistance loci (QRLs). This review deals with resistance for the following four-leaf spot diseases: (i) Septoria nodorum blotch (SNB) caused by Parastagonospora nodorum; (ii) Tan spot (TS) caused by Pyrenophora tritici-repentis; (iii) Spot blotch (SB) caused by Bipolaris sorokiniana and (iv) Septoria tritici blotch (STB) caused by Zymoseptoria tritici.

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3 Agriculture, Environment & Ecology
3.97 Plant Pathology
3.97.636 Fungal Plant Pathogens
Web Of Science research areas
Plant Sciences
ESI research areas
Plant & Animal Science
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