Journal article
LEED fine structure: Origins and application
Surface Science Reports, Vol.9(4), pp.165-196
1988
Abstract
For incident energies below 50 eV, high resolution low energy electron diffraction (LEED) spectra exhibit fine structure arising primarily from the scattering of electrons by the surface potential barrier. We review the experimental techniques used for measuring such spectra, and derive a model for the process involved. The comparison between measured spectra and calculations using this model provides details about the surface barrier structure and adsorption sites on metal surfaces. We discuss current applications of this technique and some promising directions for future work.
Details
- Title
- LEED fine structure: Origins and application
- Authors/Creators
- R.O. Jones (Author/Creator)P.J. Jennings (Author/Creator)
- Publication Details
- Surface Science Reports, Vol.9(4), pp.165-196
- Publisher
- Elsevier B.V.
- Identifiers
- 991005542483007891
- Copyright
- © 1988 Published by Elsevier B.V.
- Murdoch Affiliation
- School of Mathematical and Physical Sciences
- Language
- English
- Resource Type
- Journal article
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InCites Highlights
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- Citation topics
- 5 Physics
- 5.31 Silicon Systems
- 5.31.871 Silicon Surface Chemistry
- Web Of Science research areas
- Chemistry, Physical
- Physics, Condensed Matter
- ESI research areas
- Physics