Logo image
Back
Limits to Auger-electron core-loss electron coincidence spectroscopy
Journal article   Peer reviewed

Limits to Auger-electron core-loss electron coincidence spectroscopy

A.T. Stelbovics, B.D. Todd, S.M. Thurgate and B. Lohmann
Surface Science, Vol.278(1-2), pp.193-201
1992
DOI: https://doi.org/10.1016/0039-6028(92)90595-W
url
Link to Published Version *Subscription may be requiredView

Abstract

Successful X-ray excited Auger coincidence experiments from solid surfaces have been performed in the past few years. We model the count rate and signal-to-background ratio for an electron-excited Auger coincidence experiment on a silicon surface in reflection mode geometry. The dominant process leading to coincidences are shown to be of second order. A typical experiment is considered, with experimental parameters being used where required. We conclude that while such an experiment is technically feasible, the X-ray excited coincidence Auger experiments are to be preferred.

Details

Metrics

36 Record Views
4 Times Cited - Web of Science

InCites Highlights

These are selected metrics from InCites Benchmarking & Analytics tool, related to this output

Collaboration types
Domestic collaboration
Citation topics
2 Chemistry
2.15 Physical Chemistry
2.15.912 X-ray Spectroscopy
Web Of Science research areas
Chemistry, Physical
Physics, Condensed Matter
ESI research areas
Physics
Logo image