Multiple-prototype classifier design

J.C. Bezdek; T.R. Reichherzer; G.S. Lim; Y. Attikiouzel

doi:10.1109/5326.661091

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Journal article

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Peer reviewed

Multiple-prototype classifier design

J.C. Bezdek, T.R. Reichherzer, G.S. Lim and Y. Attikiouzel

IEEE Transactions on Systems, Man and Cybernetics, Part C (Applications and Reviews), Vol.28(1), pp.67-79

1998

DOI: https://doi.org/10.1109/5326.661091

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Abstract

Five methods that generate multiple prototypes from labeled data are reviewed. Then we introduce a new sixth approach, which is a modification of Chang's (1974) method. We compare the six methods with two standard classifier designs: the 1-nearest prototype (1-np) and 1-nearest neighbor (1-nn) rules. The standard of comparison is the resubstitution error rate; the data used are the Iris data. Our modified Chang's method produces the best consistent (zero-error) design. One of the competitive learning models produces the best minimal prototypes design (five prototypes that yield three resubstitution errors)

Details

Title: Multiple-prototype classifier design
Authors/Creators: J.C. Bezdek (Author/Creator) - University of West Florida
T.R. Reichherzer (Author/Creator) - University of West Florida
G.S. Lim (Author/Creator) - Australian Research Centre for Medical Engineering
Y. Attikiouzel (Author/Creator) - Department of Physics, Mathematics and Informatics
Publication Details: IEEE Transactions on Systems, Man and Cybernetics, Part C (Applications and Reviews), Vol.28(1), pp.67-79
Publisher: IEEE
Identifiers: 991005540632407891
Murdoch Affiliation: Murdoch University
Language: English
Resource Type: Journal article

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Collaboration types: Domestic collaboration; International collaboration
Citation topics: 4 Electrical Engineering, Electronics & Computer Science; 4.61 Artificial Intelligence & Machine Learning; 4.61.145 Classification Algorithms
Web Of Science research areas: Computer Science, Artificial Intelligence; Computer Science, Cybernetics; Computer Science, Interdisciplinary Applications
ESI research areas: Engineering