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Observations of LEED fine structure on the low-index planes of copper
Journal article   Peer reviewed

Observations of LEED fine structure on the low-index planes of copper

S.M. Thurgate and P.J. Jennings
Surface Science, Vol.114(2-3), pp.395-404
1982
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Abstract

A study of LEED fine structure on the low-index planes of copper reveals that surface barrier resonances are present on all planes at low energies. The resonance features are strong on the (111) and (100) and weak on the (110) plane. Ordered oxygen chemisorption strengthens the resonances while disordered oxygen adsorption weakens them. A theoretical analysis shows that the saturated image barrier is an adequate barrier model for the resonance process. Trends in surface barrier structure between the different low-index planes of copper are discussed.

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Citation topics
5 Physics
5.31 Silicon Systems
5.31.871 Silicon Surface Chemistry
Web Of Science research areas
Chemistry, Physical
Physics, Condensed Matter
ESI research areas
Physics
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