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Positron annihilation study on ZnO-based scintillating glasses
Journal article   Peer reviewed

Positron annihilation study on ZnO-based scintillating glasses

J. Nie, R. Yu, B. Wang, Y. Ou, Y. Zhong, F. Xia and G. Chen
Applied Surface Science, Vol.255(13-14), pp.6551-6554
2009
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Abstract

Positron lifetime of ZnO-based scintillating glasses (55 − x)SiO2–45ZnO–xBaF2 (x = 5, 10, 15 mol%) were measured with a conventional fast–fast spectrometer. Three positron lifetime components τ1, τ2, and τ3 are ∼0.23 ns, ∼0.45 ns, and ∼1.6 ns, respectively. All the three positron lifetime components first increase with increasing BaF2 concentration from 5 mol% to 10 mol%, then decreases as BaF2 further increases to 15 mol%. The result suggests that the glass sample with 10 mol% BaF2 contains the highest defect density, and is in excellent agreement with glass chemistry, glass density, thermal properties, and calculated crystallinity. Therefore, positron annihilation lifetime measurement is an effective tool for analyzing defects in ZnO-based scintillating glasses.

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Collaboration types
Domestic collaboration
International collaboration
Citation topics
5 Physics
5.200 Nuclear Fusion
5.200.1596 Positronium
Web Of Science research areas
Chemistry, Physical
Materials Science, Coatings & Films
Physics, Applied
Physics, Condensed Matter
ESI research areas
Materials Science
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