Logo image
Surface barrier determination using spin-polarized LEED: W(001)
Journal article   Peer reviewed

Surface barrier determination using spin-polarized LEED: W(001)

P.J. Jennings and R.O. Jones
Solid State Communications, Vol.44(1), pp.17-22
1982
url
Link to Published Version *Subscription may be requiredView

Abstract

Spin-polarized LEED intensities have been calculated for the W(001) surface for a variety of surface barriers and compared with both spin-polarized measurements (15° ≤ angle of incidence Θ≤45°) and high resolution unpolarized data (Θ=48°). Observed features, in particular the striking differences between spin-up and spin-down intensities, are reproduced satisfactorily by a barrier with an image plane 3.3 bohr from the outermost atomic layer and with a value of 70% of the bulk inner potential at that layer.

Details

Metrics

InCites Highlights

These are selected metrics from InCites Benchmarking & Analytics tool, related to this output

Collaboration types
Domestic collaboration
International collaboration
Citation topics
5 Physics
5.31 Silicon Systems
5.31.871 Silicon Surface Chemistry
Web Of Science research areas
Physics, Condensed Matter
ESI research areas
Physics
Logo image