Journal article
Techniques for very low energy electron diffraction
Review of Scientific Instruments, Vol.51(5), pp.605-609
1980
Abstract
LEED intensity curves between 0–50 eV contain sharp peaks due to electronic surface resonances. Successful comparison with theory requires an accurate knowledge of the incidence angles and energy resolution ≲0.15 eV. It is shown that these requirements can be achieved with a conventional LEED system. The resolution was obtained by doubly modulating the four grid retarding optics and the electron gun. The incidence angles were found with a simple photographic technique.
Details
- Title
- Techniques for very low energy electron diffraction
- Authors/Creators
- G.L. Price (Author/Creator)
- Publication Details
- Review of Scientific Instruments, Vol.51(5), pp.605-609
- Publisher
- American Institute of Physics
- Identifiers
- 991005542236707891
- Copyright
- © 1980 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
- Murdoch Affiliation
- Murdoch University
- Language
- English
- Resource Type
- Journal article
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- Citation topics
- 5 Physics
- 5.31 Silicon Systems
- 5.31.871 Silicon Surface Chemistry
- Web Of Science research areas
- Instruments & Instrumentation
- Physics, Applied
- ESI research areas
- Chemistry