The analysis of LEED fine structure

P.J. Jennings; S.M. Thurgate; G.L. Price

doi:10.1016/0378-5963(82)90025-3

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Journal article

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The analysis of LEED fine structure

P.J. Jennings, S.M. Thurgate and G.L. Price

Applications of Surface Science, Vol.13(1-2), pp.180-189

1982

DOI: https://doi.org/10.1016/0378-5963(82)90025-3

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Abstract

LEED intensity curves at low primary beam energies exhibit surface barrier resonance fine structure. These resonances are due to the interference between electron waves diffracted by the crystal surface and waves internally reflected by the surface barrier. The resonance profiles may be analysed to test various theoretical models of the surface barrier and to obtain structural details for adsorbate overlayers. We report recent studies on the (001) planes of Cu and Ni and discuss the information they provide about the structure of the metal/vacuum interface.

Details

Title: The analysis of LEED fine structure
Authors/Creators: P.J. Jennings (Author/Creator) - Murdoch University
S.M. Thurgate (Author/Creator) - Murdoch University
G.L. Price (Author/Creator) - Murdoch University
Publication Details: Applications of Surface Science, Vol.13(1-2), pp.180-189
Publisher: Elsevier BV
Identifiers: 991005540721107891
Murdoch Affiliation: School of Mathematical and Physical Sciences
Language: English
Resource Type: Journal article

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