Journal article
Volume dependence of the dielectric properties of amorphous SiO2
Physical Chemistry Chemical Physics, Vol.18(10), pp.7483-7489
2016
Abstract
Using first principles calculations, the analysis of the dielectric properties of amorphous SiO2 (am-SiO2) was performed. We found that the am-SiO2 properties are volume dependent, and the dependence is mainly induced by the variation of nanoporosity at the atomic scale. In particular, both ionic and electronic contributions to the static dielectric constants are functions of volume with clear trends. Moreover, using the unique parameterization of the dielectric function provided in this work, we predict dielectric functions at imaginary frequencies of different SiO2 polymorphs having similar band gap energies.
Details
- Title
- Volume dependence of the dielectric properties of amorphous SiO2
- Authors/Creators
- O.I. Malyi (Author/Creator) - University of OsloM. Boström (Author/Creator) - University of OsloV.V. Kulish (Author/Creator) - National University of SingaporeP. Thiyam (Author/Creator) - KTH Royal Institute of TechnologyD.F. Parsons (Author/Creator) - Murdoch UniversityC. Persson (Author/Creator) - KTH Royal Institute of Technology
- Publication Details
- Physical Chemistry Chemical Physics, Vol.18(10), pp.7483-7489
- Publisher
- Royal Society of Chemistry
- Identifiers
- 991005540230007891
- Copyright
- © the Owner Societies 2016
- Murdoch Affiliation
- School of Engineering and Information Technology
- Language
- English
- Resource Type
- Journal article
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