Files and links (1)
CC BY-NC-SA V4.0, Open Access
Journal article
Morphological and Seed Quality Characterization of Emmer Wheat (Triticum dicoccum) germplasm : Characterization of Emmer Wheat (Triticum dicoccum) germplasm
Journal of Cereal Research, Vol.15(2), pp.249-260
2024
Abstract
A set of emmer wheat germplasm lines were studied for eight (08) morphological viz., days to 50% flowering, days to maturity, plant height (cm), number of tillers per plant, spike length (cm), number of spikes per plant, number of grains per spikes and grain yield per plant, and eight (08) seed quality parameters viz., grain length, grain breadth, 1000 grain weight (g), standard germination (%), electrical conductivity, seed density, seed vigour index-I, seed vigour index-II. The analysis of variance (ANOVA) of germplasm lines for morphological traits revealed that the mean square for blocks were significant for all the traits except for days to 50% flowering and number of spikes per plant. The mean square value of treatments was found significant for all traits except for spike length and days to maturity. The analysis of variance (ANOVA) for eight (08) seed quality parameters depicted highly significant differences among the genotypes for all the traits under study. The study could identify seven (07) emmer wheat genotypes showing significant and variable expression for morphological traits, twelve (12) genotypes revealed significant seed quality parameters, while twenty nine (29) genotypes were resistant to leaf blight disease. Overall the genotype EW-192 possessed significant yield traits with resistance to leaf blight, while genotypes EW-93 and EW-157 carried good seed quality parameters in combination with resistance to leaf blight. The identified sources for improvement of morphological, yield attributing and seed quality traits and leaf blight resistance could be directly used in hybridization programmes, gene transfer or introgression studies aimed at genetic improvement of bread/ emmer wheats. The sources of resistance to leaf blight identified in the study could further be tested for their effectiveness and use in gene deployment studies with ultimate goal of building a long lasting and durable leaf blight resistance in wheat.
Details
- Title
- Morphological and Seed Quality Characterization of Emmer Wheat (Triticum dicoccum) germplasm : Characterization of Emmer Wheat (Triticum dicoccum) germplasm
- Authors/Creators
- Sofora JanTahmeena BanoMushtaq A BhatR. R MirMohd Anwar KhanSanjay KumarHimani MFahim Jeelani WaniSafoora ShafiZaitoon
- Publication Details
- Journal of Cereal Research, Vol.15(2), pp.249-260
- Publisher
- Indian Council of Agricultural Research
- Identifiers
- 991005841256207891
- Copyright
- © Society for Advancement of Wheat and Barley Research
- Murdoch Affiliation
- Food Futures Institute
- Language
- English
- Resource Type
- Journal article
Metrics
1 File views/ downloads
4 Record Views